While it can be exceptionally accurate for certain applications—often achieving precision in the parts-per-million (ppm) range—its true accuracy is highly dependent on the instrument type, the calibration standard, the sample being analyzed, and the methodology used. The accuracy of an X-ray fluorescence (XRF) measurement is not a single, fixed value. Sample Homogeneity: XRF testing is more accurate when the sample is uniform. If the material has layers or is uneven, it could lead to less reliable results. These effects become relevant when an XRF analysis is performed directly on an investigated material. A typical example is XRF analyses of valuable and historical objects. X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. When a material is illuminated with high-energy X-rays, its atoms can become excited and emit their own. The quality of X-ray spectroscopy analyzer is often expressed by the theoretical statistical error of X-ray intensity measurement. The sample preparation technology. One common pitfall occurs when using the “Precious Metals” mode on these devices, which can yield inaccurate results, falsely indicating the presence of platinum, gold, palladium, or iridium in your sample.